Description |
Use |
Location |
|
|---|---|---|---|
Three-chamber Evaporation Equipment |
|
Device preparation by evaporation method |
CR1000 |
Two-chamber Evaporation Equipment |
|
Device preparation by evaporation method |
CR1000 |
Mono-chamber Evaporation Equipment with Glove Box |
|
Device preparation by evaporation method |
CR1000 |
Spattering Equipment with Glove Box |
|
Electrode preparation |
510W |
Glass chamber-type Evaporation Equipment |
|
Device preparation by evaporation method |
510E |
Glass chamber-type Evaporation Equipment |
|
Device preparation by evaporation method |
510E |
Glove Box for Film Formation by Painting |
|
Nitrogen atmosphere box for device preparation by painting method |
510W |
Glove Box for Measurement Instrument |
|
Nitrogen atmosphere box for precision measurement |
510W |
Electron Spin Resonance Analyzer |
|
Analytical equipment |
103 |
Atomic Force Microscope |
|
Analytical equipment for surface properties |
103 |
Scanning Electron Microscope |
|
High magnification microscope for analysis by surface observation |
103 |
Photoelectron Yield Spectrometer with Glove Box |
|
Electron spectroscopy equipment with nitrogen-atmospheric box |
103 |
Photoelectron Yield Spectrometer |
|
Electron spectroscopy equipment |
103 |
Transmission X-ray equipment |
|
Structure analysis equipment by X-ray |
103 |
Thin film X-ray equipment |
|
Thin film structure analysis equipment by X-ray |
103 |
Time-of-Flight equipment |
|
Measurement equipment for electron- and hole-mobility |
501 |
Spectroscopic Ellipsometer |
|
Spectroscopy analyzer |
501 |
Stylus Profiler |
|
Equipment for measurement of film thickness by contact |
510E |
Fluorescence lifetime measurement equipment with cryostat |
|
Spectrophotometer operable at low temperature |
501 |
Sublimation behavior analyzer |
|
Equipment to measure weight loss upon heating |
501 |
Fluorescence analysis equipment |
|
Spectroscopy analyzer |
501 |
Ultraviolet-visible absorption spectroscopy equipment |
|
Spectrophotometer |
501 |
Thermogravimetric Analyzer |
|
Equipment to measure weight loss upon heating |
501 |
Differential Scanning Calorimetric Analyzer |
|
Calorimetric analysis equipment |
501 |
Infrared Spectrograph |
|
Thermal analysis instrument |
501 |
HPLC High Performance Liquid Chromatograph |
|
Equipment for molecular weight measurement |
409 |
Preparative GPC |
|
Instrument for separation by molecular weight |
409 |
Gel Permeation Chromatograph |
|
Equipment for molecular weight measurement |
409 |
Near-infrared Spectro-luminance meter |
Spectrograph |
507 |
|
Mass Spectrograph |
|
Equipment for molecular weight analysis |
501 |
Automatic medium-pressure chromatograph |
|
Equipment for molecular weight measurement |
509 |
Microwave Synthesizer |
|
Synthesis equipment utilizing microwave |
509 |
Equipment for Electrochemical Measurement |
|
Equipment for electrochemical measurement and analysis |
409 |
Equipment for Lifetime Measurement of Organic Electro Luminescence Device |
|
Lifetime measurement equipment |
507 |
Luminance Meter |
|
Equipment for luminance measurement |
507 |
High-vacuum Sublimation Purifier |
|
Equipment to increase purity of organic materials |
410W |
Sublimation Purifier, Large Capacity |
|
Equipment to increase purity of organic materials |
410W |
Sublimation Purifier, Medium Capacity |
|
Equipment to increase purity of organic materials |
410W |
Sublimation Purifier, Small Capacity |
|
Equipment to increase purity of organic materials |
410W |
Scriber |
|
Equipment for polishing |
104 |
Draw Machine |
|
Equipment for polishing |
104 |
Lithographic Exposure Machine (small) |
|
Light irradiation equipment for micro pattern formation |
CR100 |
Vacuum Evaporation Equipment EO-6 |
|
preparation of organic devices |
410E |
Vacuum Evaporation Equipment EO-6 |
|
preparation of organic devices |
410E |
Vacuum Evaporation Equipment EO-5 |
|
preparation of organic devices |
410E |
Glove Box LabMaster |
|
preparation & evaluation of organic devices |
410E |
Glove Box Nexus |
|
preparation & evaluation of organic devices |
410E |
Low Temperature Prober |
|
evaluation of temperature dependency of organic devices |
410E |
UV-Visible Spectrophotometer |
|
evaluation of electron status of thin organic films |
410E |
Digital Microscope |
|
observation of structure in thin organic films |
410E |
Contact Angle Measurement System |
|
wettability evaluation of thin organic films |
410E |
Polarizing Microscope |
|
observation of structure in thin organic films |
410E |
Train Sublimation System |
|
purification of Organic Materials |
410E |
Solar Simulator |
|
performance evaluation of organic solar cells |
410E |
Action Spectrum Measurement System |
|
performance evaluation of organic solar cells |
410E |
Semiconductor Parameter Analyzer |
|
performance evaluation of organic transistors |
410E |
Source Measure Unit |
|
electric characteristics evaluation of organic devices |
410E |
Frequency Response Analyzer |
|
response rate evaluation of organic devices |
410E |
Spectroradiometer |
|
evaluation of luminescence characteristics of organic electro luminescence devices |
410E |
Spectroscopic Ellipsometer |
|
analysis of optical property and molecular orientation of thin organic films |
410W |
Vacuum-deposition chamber for in situ optical measurement |
|
real-time analysis of molecular orientation in vacuum deposition process |
410W |
Spectrophotometer |
|
measurement of absorbance of films and solutions |
410W |
Reflectivity Measurement System |
|
measurement of reflectivity of films |
410W |
Transient Emission Measurement System |
measurement of emission lifetime of devices |
410W |
|
Workstation |
quantum calculation for molecules |
407 |
|
Probe Station |
|
detection of device with probe |
510W (Glove box内) |
Semiconductor Characteristics Measurement System |
|
measurement of I-V characteristics of devices |
510W |
Layer-by-Layer Adsorption System |
|
automatic fabrication of layered thin films |
409 |
Nanocrystals and Nanoparticles Analyzer |
|
size measurement of nanocrystals/particles |
409 |
Microwave Irradiation System |
|
fabrication of nanocrystals with microwave-irradiation |
409 |
One-chamber Evaporation Equipment |
|
Device preparation by evaporation method |
1F,Build.9 |
Cluster type vacuum evaporation equipment with sputtering device |
|
Device preparation by evaporation method |
1F,Build.9 |
In-line type vacuum evaporation equipment |
|
Device preparation by evaporation method |
1F,Build.9 |
Vacuum evaporation equipment for multi photon type device |
|
Device preparation by evaporation method |
1F,Build.9 |
One-chamber Evaporation Equipment |
|
Device preparation by evaporation method |
1F,Build.9 |
Vacuum evaporation equipment for linear source development |
|
Device preparation by evaporation method |
1F,Build.9 |
Glove box for sealing process |
|
equipment for device sealing process |
1F,Build.9 |
Integrating Sphere for quantum yield measurement |
|
equipment for photometric analysis |
1F,Build.9 |
Spectroradiometer |
|
equipment for measurement of luminosity distribution |
1F,Build.9 |
Luminance Meter |
|
Equipment for luminance measurement |
1F,Build.9 |
